Browsing by author "Seidel, Felix"
Now showing items 1-12 of 12
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Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Joerg; Vandervorst, Wilfried (2010) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Jörg; Vandervorst, Wilfried (2011) -
Electrical activity of extended defects in relaxed InxGa1-xAs hetero-epitaxial layers
Claeys, Cor; Hsu, Brent; Mols, Yves; Kunert, Bernardette; Bender, Hugo; Seidel, Felix; Carolan, Patrick; Langer, Robert; Merckling, Clement; Alian, AliReza; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Simoen, Eddy (2020) -
Forksheet FETs with Bottom Dielectric Isolation, Self-Aligned Gate Cut, and Isolation between Adjacent Source-Drain Structures
Mertens, Hans; Ritzenthaler, Romain; Oniki, Yusuke; Puttarame Gowda, Pallavi; Mannaert, Geert; Sebaai, Farid; Hikavyy, Andriy; Rosseel, Erik; Dupuy, Emmanuel; Peter, Antony; Vandersmissen, Kevin; Radisic, Dunja; Briggs, Basoene; Batuk, Dmitry; Geypen, Jef; Martinez Alanis, Gerardo Tadeo; Seidel, Felix; Richard, Olivier; Chan, BT; Mitard, Jerome; Dentoni Litta, Eugenio; Horiguchi, Naoto (2022) -
Influence of carbon alloying on the thermal stability and resistive switching behavior of copper-telluride based CBRAM cells
Devulder, Wouter; Opsomer, Karl; Seidel, Felix; Belmonte, Attilio; Muller, Robert; De Schutter, Bob; Bender, Hugo; Vandervorst, Wilfried; Van Elshocht, Sven; Jurczak, Gosia; Goux, Ludovic; Detavernier, Christophe (2013) -
Post-ion beam induced degradation of copper layers in transmission electron microscopy specimens
Seidel, Felix; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2015) -
Semi-damascene Integration of a 2-layer MOL VHV Scaling Booster to Enable 4-track Standard Cells
Vega Gonzalez, Victor; Radisic, Dunja; Choudhury, Subhobroto; Tierno, Davide; Thiam, Arame; Batuk, Dmitry; Martinez Alanis, Gerardo Tadeo; Seidel, Felix; Decoster, Stefan; Kundu, Souvik; Tsvetanova, Diana; Peter, Antony; De Coster, Hanne; Sepulveda Marquez, Alfonso; Altamirano Sanchez, Efrain; Chan, BT; Drissi, Youssef; Sherazi, Yasser; Lee, Jae Uk; Ciofi, Ivan; Murdoch, Gayle; Nagesh, Nishanth; Hellings, Geert; Ryckaert, Julien; Biesemans, Serge; Dentoni Litta, Eugenio; Horiguchi, Naoto; Park, Seongho; Tokei, Zsolt (2022) -
TEM analysis and electrical probing on thin TEM lamellas of CBRAM stacks
Seidel, Felix; Richard, Olivier; Bender, Hugo; Hantschel, Thomas; Goux, Ludovic; Jurczak, Gosia; Vandervorst, Wilfried (2014) -
Thermal stability and relaxation mechanisms in compressively-strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy
Fleischmann, Claudia; Lieten, Ruben; Hermann, Peter; Hoenicke, Philipp; Beckhoff, Burkhard; Seidel, Felix; Douhard, Bastien; Richard, Olivier; Bender, Hugo; Shimura, Yosuke; Zaima, S; Uchida, Nori; Temst, Kristiaan; Vandervorst, Wilfried; Vantomme, Andre (2016) -
Thermally induced pit formation and Sn diffusion in strained GeSn films
Fleischmann, Claudia; Lieten, Ruben; Hoenicke, Philipp; Seidel, Felix; Zaima, Shimura; Conard, Thierry; Temst, Kristiaan; Vandervorst, Wilfried; Vantomme, Andre (2014) -
X-ray absorption correction in pillar shaped samples
Bender, Hugo; Seidel, Felix; Favia, Paola; Richard, Olivier (2017) -
X-ray absorption in pillar shaped transmission electron microscopy specimens
Bender, Hugo; Seidel, Felix; Favia, Paola; Richard, Olivier; Vandervorst, Wilfried (2017)