Browsing by author "Sonnenberg, V."
Now showing items 1-4 of 4
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Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETs
Itocazu, V.T.; Sonnenberg, V.; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012) -
Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Martino, Joao Antonio; Sonnenberg, V. (1996) -
Fin pitch impact on biaxial/uniaxial strain engineering of triple-gate devices
Rodrigues, M.; Sonnenberg, V.; Martino, J.A.; Collaert, Nadine; Simoen, Eddy; Claeys, Cor (2011) -
Subthreshold region analysis for UTBOX and UTBB SOI nMOSFETs with different channel lengths and silicon thickness
Silva, V.C.P.; Sonnenberg, V.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Agopian, P.G.D. (2017)