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Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Publication:
Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Date
1996
Proceedings Paper
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1458.pdf
270.64 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Lukyanchikova, N.
;
Petrichuk, M.
;
Garbar, N.
;
Martino, Joao Antonio
;
Sonnenberg, V.
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Abstract
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1974
since deposited on 2021-09-29
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1974
since deposited on 2021-09-29
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations