Publication:

Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs

Date

1996
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.contributor.authorMartino, Joao Antonio
dc.contributor.authorSonnenberg, V.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T15:25:33Z
dc.date.available2021-09-29T15:25:33Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1485
dc.source.beginpage309
dc.source.conferenceProceedings of the 7th International Symposium on Silicon-on-Insulator Technology and Devices
dc.source.conferencedate5/05/1996
dc.source.conferencelocationLos Angeles, CA USA
dc.source.endpage317
dc.title

Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
1458.pdf
Size:
270.64 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions