Publication:
Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETs
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1869 since deposited on 2021-10-20
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Acq. date: 2026-08-10
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Statistics
Views
1869 since deposited on 2021-10-20
1last month
1last week
Acq. date: 2026-08-10
Citations