Browsing by author "Gerrer, Louis"
Now showing items 1-6 of 6
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Experimental evidences and simulations of trap generation along the percolation path
Gerrer, Louis; Hussin, Razaidi; Amoroso, Salvatore Maria; Franco, Jacopo; Weckx, Pieter; Simicic, Marko; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015) -
Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Duan, Meng; Zhang, Jian Fu; Ji, Zhigang; Zhang, Wei Dong; Vigar, David; Asen, Asenov; Gerrer, Louis; Chandra, Vikas; Aitken, Rob; Kaczer, Ben (2016) -
Interplay between statistical variability and reliability in contemporary p-MOSFETs: measurements vs. simulated
Hussin, Razaidi; Amoroso, Salvatore; Gerrer, Louis; Kaczer, Ben; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Asenov, Asen (2014) -
Reliability aware simulation flow: from TCAD calibration to circuit level analysis
Hussin, Razzaidi; Gerrer, Louis; Ding, Jie; Amaroso, Salvatore; Wang, Liping; Simicic, Marko; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015) -
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
Hussin, Razaidi; Gerrer, Louis; Ding, Jie; Wang, Liping; Amoroso, Salvatore; Cheng, Binjie; Weckx, Pieter; Simicic, Marko; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015) -
TCAD-based methodology for reliability assessment of nanoscaled MOSFETs
Hussin, Razaidi; Gerrer, Louis; Amoroso, Salvatore; Wang, Liping; Weckx, Pieter; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; Horiguchi, Naoto; Kaczer, Ben; Asenov, Asen (2015)