Reliability aware simulation flow: from TCAD calibration to circuit level analysis

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33151.pdf 1.43 MB

Author(s)

Hussin, Razzaidi

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Amaroso, Salvatore

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Vanderheyden, Annelies

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Vanhaeren, Danielle

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Horiguchi, Naoto

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Metrics

1915 since deposited on 2021-10-22

Acq. date: 2025-10-27