Publication:

Reliability aware simulation flow: from TCAD calibration to circuit level analysis

Date

2015

Proceedings Paper

Simple item page Full metadata Statistics

Files

33151.pdf 1.43 MB

Author(s)

Hussin, Razzaidi

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Amaroso, Salvatore

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Vanderheyden, Annelies

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Vanhaeren, Danielle

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Horiguchi, Naoto

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Metrics

1918 since deposited on 2021-10-22

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Acq. date: 2025-12-10