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Reliability aware simulation flow: from TCAD calibration to circuit level analysis

Date

2015
Proceedings Paper
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dc.contributor.authorHussin, Razzaidi
dc.contributor.authorGerrer, Louis
dc.contributor.authorDing, Jie
dc.contributor.authorAmaroso, Salvatore
dc.contributor.authorWang, Liping
dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorFranco, Jacopo
dc.contributor.authorVanderheyden, Annelies
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorKaczer, Ben
dc.contributor.authorAsenov, Asen
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-22T19:48:34Z
dc.date.available2021-10-22T19:48:34Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25407
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7292281
dc.source.beginpage152
dc.source.conferenceInternational Conference on Simulation of Semiconductor Processes and Devices - SISPAD
dc.source.conferencedate9/09/2015
dc.source.conferencelocationWashington, DC USA
dc.source.endpage155
dc.title

Reliability aware simulation flow: from TCAD calibration to circuit level analysis

dc.typeProceedings paper
dspace.entity.typePublication
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