Browsing by author "Halliyal, A."
Now showing items 1-4 of 4
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Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stack
Degraeve, Robin; Kaczer, Ben; Houssa, Michel; Groeseneken, Guido; Heyns, Marc; Jeon, J. S.; Halliyal, A. (1999) -
Electrical properties of metal-insulator-semiconductor devices with high permittivity gate dielectric layers
Houssa, Michel; Degraeve, Robin; Heyns, Marc; Kaczer, Ben; Groeseneken, Guido; Naili, Mohamed; Mertens, Paul; Stesmans, Andre; Jeon, J. S.; Halliyal, A. (2000) -
Electrical properties of thin SiON/Ta2O5 gate dielectric stacks
Houssa, Michel; Degraeve, Robin; Mertens, Paul; Heyns, Marc; Jeon, J. S.; Halliyal, A.; Ogle, B. (1999) -
Soft breakdown in very thin Ta2 O5 gate dielectric layers
Houssa, Michel; Mertens, Paul; Heyns, Marc; Heon, J. S.; Halliyal, A.; Ogle, B. (2000)