Browsing by author "Bühler, R.T."
Now showing items 1-4 of 4
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Biaxial + uniaxial stress effectiveness in tri-gate SOI nMOSFETs with vaiable fin dimensions
Bühler, R.T.; Agopian, P.G.D.; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012) -
Biaxial stress simulation and electrical characterization of triple-gate SOI nMOSFETs
Bühler, R.T.; Agopian, P.G.D.; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012) -
Fin shape influence on the analog performance of standard and trained MuGFETs
Bühler, R.T.; Martino, J.A.; Agopian, P.G.D.; Giacomini, R.; Simoen, Eddy; Claeys, Cor (2010) -
SEG and fin dimensions influence on biaxial stress effectiveness in tri-gate SOI nMOSFETs
Bühler, R.T.; Agopian, P.G.D.; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012)