Browsing by author "Cheung, K.P."

Now showing items 1-3 of 3

Different nature of process-induced and stress-induced defects in thin SiO2 layers

Cellere, G.; Valentini, M.G.; Pantisano, Luigi; Cheung, K.P.; Paccagnella, A. (2003)
Origin of microwave noise from an n-channel metal-oxide-semiconductor

Pantisano, Luigi; Cheung, K.P. (2002)
RF performance vulnerability to hot carrier stress and consequent breakdown in low power 90nm RFCMOS

Pantisano, Luigi; Schreurs, Dominique; Kaczer, Ben; Jeamsaksiri, Wutthinan; Venegas, Rafael; Degraeve, Robin; Cheung, K.P.; Groeseneken, Guido (2003-12)