Authors

Pantisano, Luigi; Schreurs, Dominique; Kaczer, Ben; Jeamsaksiri, Wutthinan; Venegas, Rafael; Degraeve, Robin; Cheung, K.P.; Groeseneken, Guido

Conference

Technical Digest IEDM - International Electron Devices Meeting

Title

RF performance vulnerability to hot carrier stress and consequent breakdown in low power 90nm RFCMOS

Publication type

Proceedings paper