Browsing by author "Gao, Rui"
Now showing items 1-5 of 5
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A Pragmatic Model to Predict Future Device Aging
Brown, James; Tok, Kean Hong; Gao, Rui; Ji, Zhigang; Zhang, Weidong; Marsland, John S.; Chiarella, Thomas; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri; Zhang, Jian Fu (2023) -
An investigation on border traps in III-V MOSFETs with an In0.53Ga0.47As channel
Ji, Zhigang; Zhang, Xiong; Franco, Jacopo; Gao, Rui; Duan, Meng; Zhang, Jian Fu; Zhang, Wei Dong; Kaczer, Ben; Alian, AliReza; Linten, Dimitri; Zhou, Daisy; Collaert, Nadine; De Gendt, Stefan; Groeseneken, Guido (2015) -
NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling
Gao, Rui; Ji, Zhigang; Manut, Azrif B.; Zhang, Jian Fu; Franco, Jacopo; Hatta, Sharifah Wan Muhamad; Zhang, Wei Dong; Kaczer, Ben; Linten, Dimitri; Groeseneken, Guido (2017) -
Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Gao, Rui; Manut, Azrif B.; Ji, Zhigang; Ma, Jigang; Duan, Meng; Zhang, Jian Fu; Franco, Jacopo; Hatta, Sharifah Wan Muhamad; Zhang, Wei Dong; Kaczer, Ben; Vigar, David; Linten, Dimitri; Groeseneken, Guido (2017) -
Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd
Manut, Azrif; Gao, Rui; Zhang, Jian Fu; Ji, Zhigang; Mehedi, Mehzabeen; Zhang, Wei Dong; Vigar, David; Asenov, Asen; Kaczer, Ben (2019)