Browsing by author "Tian, Chunsheng"
Now showing items 1-7 of 7
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Artifacts in SIMS depth profiling
Vandervorst, Wilfried; De Witte, Hilde; Tian, Chunsheng; Geenen, Luc (1997) -
Depth Resolution and Ripple Formation on AlxGa 1-xAs
Elst, Kathy; Tian, Chunsheng; Vandervorst, Wilfried; Adams, F. (1995) -
Effects of oxygen flooding on sputtering and ionization processes during ion bombardment
Tian, Chunsheng; Vandervorst, Wilfried (1997) -
Positive ion yields under variable oxidation levels
Tian, Chunsheng; Elst, Kathy; Vandervorst, Wilfried; Maex, Karen (1997) -
Secondary ion signal variation during oxygen build-up in Si
Tian, Chunsheng; Beyer, Gerald; Vandervorst, Wilfried; Kilner, J. A. (1997) -
Segregation revisited
Tian, Chunsheng; Beyer, Gerald; Vandervorst, Wilfried; Maex, Karen; Kilner, J. A. (1997) -
Towards an understanding of ion beam mixing by quantitative internal profiling
Tian, Chunsheng; Gomez, Jose Ignacio; Beyer, Gerald; De Bisschop, Peter; Vandervorst, Wilfried; Wu, Ting-Di; D'Olieslaeger, Marc (1998)