Browsing by author "Rott, G."
Now showing items 1-2 of 2
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Characterization and modeling of charge trapping: From single defects to devices
Grasser, T.; Rzepa, G.; Waltl, M.; Goes, W.; Rott, K.; Rott, G.; Reisinger, H.; Franco, Jacopo; Kaczer, Ben (2014) -
Physical modeling of NBTI: from individual defects to devices
Rzepa, G.; Goes, W.; Rott, G.; Rott, K.; Karner, M.; Kernstock, C.; Kaczer, Ben; Reisinger, H.; Grasser, T. (2014)