Browsing by author "Sii, H. K."
Now showing items 1-7 of 7
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Degradation of oxides and oxynitrides under hot hole stress
Zhang, J.F.; Sii, H. K.; Groeseneken, Guido; Degraeve, Robin (2000) -
Generation of hole traps in silicon dioxides
Zhang, Jenny; Sii, H. K.; Groeseneken, Guido; Degraeve, Robin (2001) -
Hole trapping and trap generation in the gate silicon dioxide
Zhang, Jenny; Sii, H. K.; Groeseneken, Guido; Degraeve, Robin (2001) -
Hot hole induced degradation of oxynitrides
Sii, H. K.; Zhang, Jenny; Groeseneken, Guido (1997) -
Mechanism for the generation of interface state precursors
Zhang, J.F.; Sii, H. K.; Degraeve, Robin; Groeseneken, Guido (2000) -
Relation between hydrogen and the generation of interface state precursors
Sii, H. K.; Zhang, Jenny; Degraeve, Robin; Groeseneken, Guido (1999) -
The role of hydrogen in hole trap generation in oxides and oxynitrides
Zhang, Wenqi; Sii, H. K.; Chen, A. H.; Zhao, Chao; Uren, M. J.; Groeseneken, Guido; Degraeve, Robin (2001)