Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Hole trapping and trap generation in the gate silicon dioxide
Publication:
Hole trapping and trap generation in the gate silicon dioxide
Date
2001
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Jenny
;
Sii, H. K.
;
Groeseneken, Guido
;
Degraeve, Robin
Journal
IEEE Trans. Electron Devices
Abstract
Description
Metrics
Views
1932
since deposited on 2021-10-14
424
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1932
since deposited on 2021-10-14
424
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations