Publication:
Hole trapping and trap generation in the gate silicon dioxide
Date
| dc.contributor.author | Zhang, Jenny | |
| dc.contributor.author | Sii, H. K. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.date.accessioned | 2021-10-14T18:30:50Z | |
| dc.date.available | 2021-10-14T18:30:50Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5868 | |
| dc.source.beginpage | 1127 | |
| dc.source.endpage | 1135 | |
| dc.source.issue | 6 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 48 | |
| dc.title | Hole trapping and trap generation in the gate silicon dioxide | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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