Degradation of oxides and oxynitrides under hot hole stress

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Authors

Zhang, J.F.; Sii, H. K.; Groeseneken, Guido; Degraeve, Robin

Issue

2

Journal

IEEE Trans. Electron Devices

Volume

47

Title

Degradation of oxides and oxynitrides under hot hole stress

Publication type

Journal article

Embargo date

9999-12-31

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