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Degradation of oxides and oxynitrides under hot hole stress
Publication:
Degradation of oxides and oxynitrides under hot hole stress
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, J.F.
;
Sii, H. K.
;
Groeseneken, Guido
;
Degraeve, Robin
Journal
IEEE Trans. Electron Devices
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1917
since deposited on 2021-10-14
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Acq. date: 2025-12-08
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Metrics
Views
1917
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2025-12-08
Citations