Browsing by author "Vinicius de Oliveira, Alberto"
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Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures
Vinicius de Oliveira, Alberto; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor; Collaert, Nadine; Thean, Aaron (2016) -
Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs
Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini Der Agopian, Paula; Martino, Joao Antonio; Mitard, Jerome; Witters, Liesbeth; Langer, Robert; Collaert, Nadine; Claeys, Cor; Thean, Aaron (2016) -
Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs
Vinicius de Oliveira, Alberto; Agopian, G.D.; Martino, J.; Simoen, Eddy; Claeys, Cor; Mertens, Hans; Collaert, Nadine; Thean, Aaron (2016) -
Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes
Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini der Agopian, Paula; Martino, Joao Antonio; Witters, Liesbeth; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016) -
Low frequency noise and fin width study of Si passivated Ge pFinFETs
Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini Der Agopian, Paula; Martino, Joao Antonio; Mitard, Jerome; Witters, Liesbeth; Langer, Robert; Collaert, Nadine; Claeys, Cor; Thean, Aaron (2016)