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Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs
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Authors
Vinicius de Oliveira, Alberto
;
Agopian, G.D.
;
Martino, J.
;
Simoen, Eddy
;
Claeys, Cor
;
Mertens, Hans
;
Collaert, Nadine
;
Thean, Aaron
ISSN
1807-1953
Issue
1
Journal
Journal of Integrated Circuits and Systems
Volume
11
Title
Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs
Publication type
Journal article
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