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Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs
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Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vinicius de Oliveira, Alberto
;
Agopian, G.D.
;
Martino, J.
;
Simoen, Eddy
;
Claeys, Cor
;
Mertens, Hans
;
Collaert, Nadine
;
Thean, Aaron
Journal
Journal of Integrated Circuits and Systems
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1906
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Views
1906
since deposited on 2021-10-23
1
last month
1
last week
Acq. date: 2025-12-10
Citations