Browsing by author "Yin, KaiMin"
Now showing items 1-2 of 2
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Achieving conduction band-edge effective work functions by La2O3 capping of hafnium silicates
Ragnarsson, Lars-Ake; Chang, Vincent; Yu, HongYu; Cho, Hag-Ju; Conard, Thierry; Yin, KaiMin; Delabie, Annelies; Swerts, Johan; Schram, Tom; De Gendt, Stefan; Biesemans, Serge (2007-06) -
Effects of Al2O3 dielectric cap and nitridation on device performance, scalability, and reliability for advanced high-k/metal gate pMOSFET applications
Chang, Vincent; Ragnarsson, Lars-Ake; Yu, HongYu; Aoulaiche, Marc; Conard, Thierry; Yin, KaiMin; Schram, Tom; Maes, Jan Willem; De Gendt, Stefan; Biesemans, Serge (2007)