Browsing by author "Wellard, C.J."
Now showing items 1-2 of 2
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Gate-induced quantum- confinement transition of a single dopant atom in a silicon FinFET
Lansbergen, G.P.; Rahman, R.; Wellard, C.J.; Woo, I.; Caro, J.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2008) -
Transport-based dopant metrology in advanced FinFETs
Lansbergen, G.P.; Rahman, R.; Wellard, C.J.; Caro, J.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2008)