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Transport-based dopant metrology in advanced FinFETs
Publication:
Transport-based dopant metrology in advanced FinFETs
Date
2008
Proceedings Paper
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16634.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lansbergen, G.P.
;
Rahman, R.
;
Wellard, C.J.
;
Caro, J.
;
Collaert, Nadine
;
Biesemans, Serge
;
Klimeck, G.
;
Hollenberg, L.C.L.
;
Rogge, S.
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1912
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
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Views
1912
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations