Browsing by author "Hartwich, J."
Now showing items 1-9 of 9
-
Characterization of ultra-thin SOI transistors down to 20nm gate length regime with scanning spreading resistance microscopy (SSRM)
Hartwich, J.; Alvarez, David; Dreeskornfeld, L.; Specht, M.; Vandervorst, Wilfried; Risch, Lothar (2003) -
Fabrication and characterization of full diamond tips for scanning-spreading resistance microscopy
Alvarez, David; Fouchier, Marc; Kretz, J.; Hartwich, J.; Schoemann, S.; Vandervorst, Wilfried (2004-06) -
High resolution 2D scanning spreading resistance microscopy (SSRM) of thin film SOI MOSFETs with ultra short effective channel length
Hartwich, J.; Alvarez, David; Dreeskornfeld, L.; Hoffman, F.; Kretz, J.; Landgraf, E.; Luyken, R.J.; Rösner, W.; Schulz, T.; Specht, M.; Städele, M.; Vandervorst, Wilfried; Risch, Lothar (2003) -
High resolution scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices and double-gate transistors
Alvarez, David; Fouchier, Marc; Hartwich, J.; Eyben, Pierre; Vandervorst, Wilfried (2003) -
High-resolution scanning spreading resistance microscopy of surrounding-gate transistors
Alvarez, D.; Schömann, S.; Goebel, B.; Manger, D.; Schlösser, T.; Slesazeck, S.; Hartwich, J.; Kretz, J.; Eyben, Pierre; Fouchier, Marc; Vandervorst, Wilfried (2004-01) -
Scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices
Alvarez, David; Hartwich, J.; Kretz, J.; Fouchier, Marc; Vandervorst, Wilfried (2003) -
Scanning spreading resistance microscopy of fully depleted SOI devices
Alvarez, David; Hartwich, J.; Kretz, J.; Fouchier, Marc (2002) -
Sub-5-nm-spatial resolution in scanning spreading resistance microscopy using full-diamond tips
Alvarez, D.; Hartwich, J.; Fouchier, Marc; Eyben, Pierre; Vandervorst, Wilfried (2003) -
Two-dimensional carrier profiling in advanced devices with pico-meter resolution
Vandervorst, Wilfried; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Hartwich, J.; Slesazech, S.; Verheyen, Peter; Hogg, S. (2004)