Browsing by author "Yamakawa, Shinya"

Now showing items 1-2 of 2

    • A fully-integrated method for RTN parameter extraction 

      Simicic, Marko; Morrison, Sebastien; Parvais, Bertrand; Weckx, Pieter; Kaczer, Ben; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Nomoto, Kazuki; Ono, Makoto; Linten, Dimitri; Verkest, Diederik; Wambacq, Piet; Groeseneken, Guido; Gielen, Georges (2017)

    • Defect-based compact modeling for RTN and BTI variability 

      Weckx, Pieter; Simicic, Marko; Nomoto, Kazuki; Ono, Makoto; Parvais, Bertrand; Kaczer, Ben; Raghavan, Praveen; Linten, Dimitri; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Spessot, Alessio; Verkest, Diederik; Mocuta, Anda (2017)