Defect-based compact modeling for RTN and BTI variability

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Authors
Weckx, Pieter; Simicic, Marko; Nomoto, Kazuki; Ono, Makoto; Parvais, Bertrand; Kaczer, Ben; Raghavan, Praveen; Linten, Dimitri; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Spessot, Alessio; Verkest, Diederik; Mocuta, Anda
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Defect-based compact modeling for RTN and BTI variability
Publication type
Proceedings paper
Embargo date
9999-12-31
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