Browsing by author "Idemoto, Tatsuya"
Now showing items 1-2 of 2
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Gate-length dependent radiation damage in 2-MeV electron-irradiated Si1-xGexS/D p-MOSFETs
Nakashima, Toshiyuki; Idemoto, Tatsuya; Tsunoda, Isao; Takakura, Kenichiro; Yoneoka, Masashi; Ohyama, Hidenori; Yoshino, Kenji; Simoen, Eddy; Claeys, Cor (2012) -
Local compressive stress generation in electron irradiated boron-doped Si0.75Ge0.25/Si devices
Tsunoda, Isao; Nakashima, Toshiyuki; Naka, Noboyuki; Idemoto, Tatsuya; Yoneoka, Masahi; Takakura, Kenichiro; Yoshino, Kenji; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor; Ohyama, Hidenori (2012)