Publication:
Gate-length dependent radiation damage in 2-MeV electron-irradiated Si1-xGexS/D p-MOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
2036 since deposited on 2021-10-20
1last month
Acq. date: 2026-09-21
Citations
Statistics
Views
2036 since deposited on 2021-10-20
1last month
Acq. date: 2026-09-21
Citations