Browsing by author "Lee, Shih Chung"
Now showing items 1-2 of 2
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Characteristics of low-energy nitrogen ion-implanted oxide and NO-annealed gate dielectrics
Lee, Shih Chung; Simoen, Eddy; Badenes, Gonçal (2004) -
Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Lokshin, M.; Lee, Shih Chung; Simoen, Eddy; Claeys, Cor (2005)