Browsing by author "Van de Mieroop, Koen"
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Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
Kaczer, Ben; Degraeve, Robin; Rasras, Mahmoud; De Keersgieter, An; Van de Mieroop, Koen; Groeseneken, Guido (2002) -
Consistent model for short-channel NMOSFET after hard gate oxide breakdown
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Simons, Veerle; Groeseneken, Guido (2002) -
Consistent model for short-channel nMOSFET post-hard-breakdown characteristics
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Bearda, Twan; Groeseneken, Guido (2001) -
Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; Rasras, Mahmoud; Van de Mieroop, Koen; Roussel, Philippe; Groeseneken, Guido (2002) -
Impact of oxide breakdown on FET and circuit operation and reliability
Kaczer, Ben; Degraeve, Robin; De Keersgieter, An; Van de Mieroop, Koen; Rasras, Mahmoud; Simons, Veerle; Roussel, Philippe; Groeseneken, Guido (2001)