Authors

Kaczer, Ben; Degraeve, Robin; Rasras, Mahmoud; De Keersgieter, An; Van de Mieroop, Koen; Groeseneken, Guido

Issue

4_5

Journal

Microelectronics Reliability

Volume

42

Title

Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study

Publication type

Journal article

Embargo date

9999-12-31