Browsing by author "Smedes, Theo"
Now showing items 1-2 of 2
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HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform
Muhonen, Kathleen; Ashton, Robert; Smedes, Theo; Scholz, Mirko; Velghe, Rudolf; Peachey, Nathaniel; Barth, Jon; Stadler, Wolfgang; Grund, Evan (2012-09) -
HMM single site testing: Can we reproduce component failure level with the HMM document?
Scholz, Mirko; Ashton, Robert; Smedes, Theo; Derikx, Richard; Dekker, Marcel; Barth, Jon (2016-09)