HMM single site testing: Can we reproduce component failure level with the HMM document?

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Authors
Scholz, Mirko; Ashton, Robert; Smedes, Theo; Derikx, Richard; Dekker, Marcel; Barth, Jon
Conference
38th Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD
Title
HMM single site testing: Can we reproduce component failure level with the HMM document?
Publication type
Proceedings paper
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