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HMM single site testing: Can we reproduce component failure level with the HMM document?

Date

2016-09
Proceedings Paper
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dc.contributor.authorScholz, Mirko
dc.contributor.authorAshton, Robert
dc.contributor.authorSmedes, Theo
dc.contributor.authorDerikx, Richard
dc.contributor.authorDekker, Marcel
dc.contributor.authorBarth, Jon
dc.date.accessioned2021-10-23T14:41:03Z
dc.date.available2021-10-23T14:41:03Z
dc.date.issued2016-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27279
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7592539/?tp=&arnumber=7592539
dc.source.beginpage3B.3
dc.source.conference38th Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD
dc.source.conferencedate11/09/2016
dc.source.conferencelocationAnaheim, CA USA
dc.title

HMM single site testing: Can we reproduce component failure level with the HMM document?

dc.typeProceedings paper
dspace.entity.typePublication
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