Browsing by author "Russ, Christian"
Now showing items 21-29 of 29
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NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Verhaege, Koen; Luchies, J. M.; Russ, Christian; Groeseneken, Guido; Kuper, F. (1995) -
Non-uniform triggering of gg-n MOSt investigated by combined emission microscopy and transmission line pulsing
Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1998) -
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
Russ, Christian; Bock, Karlheinz; Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman (1999) -
Process and device design influence on the ESD performance of a fully silicided 0.25mm CMOS technology
Bock, Karlheinz; Russ, Christian; Badenes, Gonçal; Groeseneken, Guido; Deferm, Ludo (1997) -
Recommendations to further improvements of HBM ESD component level test specifications
Verhaege, Koen; Russ, Christian; Robinson-Hahn, D.; Farris, M.; Scanlon, J.; Lin, Don; Veltri, J.; Groeseneken, Guido (1996) -
SCCF - System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Griffoni, Alessio; Russ, Christian; Stadler, Wolfgang; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010) -
Simulation study for the CDM ESD behaviour of the grounded-gate nMOS
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Groeseneken, Guido; Maes, Herman (1996) -
System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Russ, Christian; Stadler, Wolfgang; Sawada, Masanori; Groeseneken, Guido (2010) -
Understanding the optimization of sub-45nm FinFET devices for ESD applications
Tremouilles, David; Thijs, Steven; Russ, Christian; Schneider, J.; Duvvury, Charvarka; Collaert, Nadine; Linten, Dimitri; Scholz, Mirko; Jurczak, Gosia; Gossner, Harald; Groeseneken, Guido (2007)