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Understanding the optimization of sub-45nm FinFET devices for ESD applications
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Authors
Tremouilles, David
;
Thijs, Steven
;
Russ, Christian
;
Schneider, J.
;
Duvvury, Charvarka
;
Collaert, Nadine
;
Linten, Dimitri
;
Scholz, Mirko
;
Jurczak, Gosia
;
Gossner, Harald
;
Groeseneken, Guido
Conference
EOS/ESD Symposium Proceedings
Title
Understanding the optimization of sub-45nm FinFET devices for ESD applications
Publication type
Proceedings paper
Embargo date
9999-12-31
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