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Understanding the optimization of sub-45nm FinFET devices for ESD applications
Publication:
Understanding the optimization of sub-45nm FinFET devices for ESD applications
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Date
2007
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tremouilles, David
;
Thijs, Steven
;
Russ, Christian
;
Schneider, J.
;
Duvvury, Charvarka
;
Collaert, Nadine
;
Linten, Dimitri
;
Scholz, Mirko
;
Jurczak, Gosia
;
Gossner, Harald
;
Groeseneken, Guido
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2008
since deposited on 2021-10-16
4
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
2008
since deposited on 2021-10-16
4
last month
Acq. date: 2025-12-10
Citations