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Process and device design influence on the ESD performance of a fully silicided 0.25mm CMOS technology
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Authors
Bock, Karlheinz
;
Russ, Christian
;
Badenes, Gonçal
;
Groeseneken, Guido
;
Deferm, Ludo
Conference
Proceedings of the ESD Forum; Berlin, October 1997.
Title
Process and device design influence on the ESD performance of a fully silicided 0.25mm CMOS technology
Publication type
Proceedings paper
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