Browsing by author "Iwai, Hiroshi"
Now showing items 1-3 of 3
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Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Dou, Chunmeng; Lin, Dennis; Vais, Abhitosh; Ivanov, Tsvetan; Chen, Han-Ping; Martens, Koen; Kakushima, Kuniyuki; Iwai, Hiroshi; Taur, Yuan; Thean, Aaron; Groeseneken, Guido (2014) -
Experimental details of a steep-slope ferroelectric InGaAs Tunnel-FET with high-quality PZT and Modeling insights in the transient polarization
Verhulst, Anne; Saeidi, Ali; Stolichnov, Igor; Alian, AliReza; Iwai, Hiroshi; Collaert, Nadine; Ionescu, Adrian (2020) -
Near hysteresis-free negative capacitance InGaAs tunnel FETs with enhanced digital and analog figures of merit below Vdd=400mV
Saeidi, Ali; Verhulst, Anne; Stolichnov, Igor; Alian, AliReza; Iwai, Hiroshi; Collaert, Nadine; Ionescu, Adrian (2018-12)