Browsing by author "Higgs, V."
Now showing items 1-3 of 3
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Measurement, modelling and simulation of defects in as-grown Czrochalski silicon
Vanhellemont, Jan; Senkader, S.; Kissinger, G.; Higgs, V.; Trauwaert, Marie-Astrid; Graef, D.; Lambert, U.; Wagner, Patrick (1997) -
Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Vanhellemont, Jan; Servidori, M.; Higgs, V.; Gramenova, Emilia; Simoen, Eddy; Jansen, Philippe (1996) -
Non-destructive techniques for identification and control of processing induced extended defects in silicon and correlation with device yield
Vanhellemont, Jan; Milita, S.; Servidori, M.; Higgs, V.; Kissinger, G.; Gramenova, Emilia; Simoen, Eddy; Jansen, Philippe (1997)