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Measurement, modelling and simulation of defects in as-grown Czrochalski silicon
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Measurement, modelling and simulation of defects in as-grown Czrochalski silicon
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Senkader, S.
;
Kissinger, G.
;
Higgs, V.
;
Trauwaert, Marie-Astrid
;
Graef, D.
;
Lambert, U.
;
Wagner, Patrick
Journal
Journal of Crystal Growth
Abstract
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1998
since deposited on 2021-09-30
2
last month
1
last week
Acq. date: 2026-01-08
Citations
Metrics
Views
1998
since deposited on 2021-09-30
2
last month
1
last week
Acq. date: 2026-01-08
Citations