Browsing by author "Qiao, Fengying"

Now showing items 1-2 of 2

A proper approach to characterize retention-after-cycling in 3D-Flash devices

Qiao, Fengying; Arreghini, Antonio; Blomme, Pieter; Van den Bosch, Geert; Pan, Liyang; Xu, Jun; Van Houdt, Jan (2013)
Reliability comparison of ISSG oxide and HTO as tunnel dielectric in 3-D–SONOS applications

Qiao, Fengying; Arreghini, Antonio; Blomme, Pieter; Date, Lucien; Van den Bosch, Geert; Liyang, Pan; Jun, Xu; Van Houdt, Jan (2013)