Browsing by author "Silverans, R. E."
Now showing items 1-5 of 5
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A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
Watté, J.; Wuyts, Koen; Silverans, R. E.; Van Hove, Marleen; Van Rossum, Marc (1994) -
Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures
Wuyts, Koen; Watté, J.; Silverans, R. E.; Van Hove, Marleen; Borghs, Gustaaf; Palmstrøm, C. J.; Florez, L. T.; Münder, H. (1994) -
Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy
Watté, J.; Provoost, R.; Silverans, R. E.; De Wolf, Ingrid; Maes, Herman (1995) -
Structural and electronic properties of pulsed laser beam mixed Ni/GaAs
Watte, J.; Silverans, R. E.; Van Hove, Marleen; Apetz, R.; Munder, H. (1994) -
The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy
Watté, J.; Silverans, R. E.; Münder, H.; Palmstrøm, C. J.; Florez, L. T.; Van Hove, Marleen; Borghs, Gustaaf; Wuyts, Koen (1994)