Browsing by author "Barry, K."
Now showing items 1-4 of 4
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Characterization of integrated optical CD for process control
Yu, J.; Uchida, J.; Van Dommelen, Y.; Carpaij, R.; Cheng, Shaunee; Pollentier, Ivan; Viswanathan, A.; Lane, L.; Barry, K.; Jakatdar, N. (2004) -
In-line litho cluster monitoring and control using integrated scatterometry
Pollentier, Ivan; Cheng, Shaunee; Baudemprez, Bart; Laidler, David; van Dommelen, Y.; Carpaij, R.; Yu, J.; Uchida, J.; Viswanathan, A.; Chin, D.T.; Barry, K.; Jakatdar, N. (2004-02) -
Integrated scatterometry for contact hole monitoring
Barry, K.; Cheng, Shaunee; Storms, Greet; Baudemprez, Bart (2004) -
Integrated scatterometry for contact hole monitoring
Cheng, Shaunee; Storms, Greet; Baudemprez, Bart; Barry, K. (2004)