Browsing by author "Jiao, Hailong"
Now showing items 1-9 of 9
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A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
Cao, Xugang; Jiao, Hailong; Marinissen, Erik Jan (2022) -
Embedded toggle generator to control the switching activity
Katselas, Leonidas; Athanasiadis, Angelos; Hatzopoulos, Alkis; Jiao, Hailong; Papameletis, Christos; Marinissen, Erik Jan (2017-09) -
Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs
Katselas, Leonidas; Hatzopoulos, Alkis; Jiao, Hailong; Papameletis, Christos; Marinissen, Erik Jan (2018-05) -
Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages
Cron, Adam; Jiao, Hailong; Marinissen, Erik Jan (2022) -
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers
Li, Yu; Shao, Ming; Jiao, Hailong; Cron, Adam; Bhatia, Sandeep; Marinissen, Erik Jan (2018-05) -
IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs
Marinissen, Erik Jan; McLaurin, Teresa; Jiao, Hailong (2016-05) -
On-chip toggle generators to provide realistic conditions during test of digital 2D-SoCs and 3D-SICs
Katselas, Leonidas; Hatzopoulos, Alkis; Jiao, Hailong; Papameletis, Christos; Marinissen, Erik Jan (2018-11) -
Receiver Design With an Adjustable Energy-Signal-Quality Tradeoff for IoT Networks
Detterer, Paul; Nabi, Majid; Jiao, Hailong; Basten, Twan (2022) -
Testing for internal defects in library cells
Gao, Zhan; Jiao, Hailong; Huisken, Jos; Marinissen, Erik Jan; Chickermane, Vivek; Swenton, Joe; Wisnesky, Carl; Goossens, Kees (2017-05)