Publication:

A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability

Date

2022
Journal article
https://doi.org/10.1109/TCSII.2021.3096885
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Author(s)

Cao, Xugang
;
Jiao, Hailong
;
Marinissen, Erik Jan  

Journal

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

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