Publication:
A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
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Acq. date: 2026-08-06
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933 since deposited on 2022-03-09
80last month
12last week
Acq. date: 2026-08-06
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1912 since deposited on 2022-03-09
1last month
1last week
Acq. date: 2026-08-06
Citations