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A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
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Authors
Cao, Xugang
;
Jiao, Hailong
;
Marinissen, Erik Jan
DOI
10.1109/TCSII.2021.3096885
ISSN
1549-7747
Issue
2
Journal
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
Volume
69
Title
A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
Publication type
Journal article
Embargo date
2022-02-28
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